DocumentCode
1024768
Title
Ferroelectric field effect device
Author
Heilmeier, G.H. ; Heyman, P.M.
Volume
12
Issue
9
fYear
1965
fDate
9/1/1965 12:00:00 AM
Firstpage
508
Lastpage
508
Keywords
Admittance measurement; Capacitance measurement; Conducting materials; Crystalline materials; Dielectric losses; Ferroelectric materials; Frequency; Laboratories; Thin film devices; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1965.15587
Filename
1474051
Link To Document