Title :
Tunable high-pass filter characteristics of a special MOS transistor
fDate :
9/1/1965 12:00:00 AM
Keywords :
Admittance measurement; Capacitance measurement; Conducting materials; Dielectric losses; Ferroelectric materials; Filters; Frequency; Laboratories; MOSFETs; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1965.15589
