• DocumentCode
    1024807
  • Title

    Electrostatic discharge testing of integrated circuits using step-stress transients or multiple transients

  • Author

    Shaw, R.N. ; Enoch, R.D.

  • Author_Institution
    British Telecom Research Laboratories, Ipswich, UK
  • Volume
    22
  • Issue
    15
  • fYear
    1986
  • Firstpage
    813
  • Lastpage
    815
  • Abstract
    A model has been developed which accounts for the damage behaviour of the on-chip input protection diode of an IC subjected either to multiple-transient testing or to step-stress testing.
  • Keywords
    discharges (electric); integrated circuit testing; overvoltage protection; ESD testing; IC; damage behaviour; electrostatic discharge testing; integrated circuits; model; multiple transients; multiple-transient testing; on-chip input protection diode; step-stress testing; step-stress transients;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860558
  • Filename
    4256762
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1024807