DocumentCode :
1024835
Title :
Influence of nonequilibrium carriers on the surface breakdown of N + P diodes and MOS-structures
Author :
Schroen, W.
Volume :
12
Issue :
9
fYear :
1965
fDate :
9/1/1965 12:00:00 AM
Firstpage :
509
Lastpage :
509
Keywords :
Conductivity; Electric breakdown; Gallium arsenide; Gold; Heterojunctions; Laboratories; Lighting; Semiconductor diodes; Semiconductor films; Silicon;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1965.15595
Filename :
1474059
Link To Document :
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