DocumentCode
1025091
Title
Solution of semiconductor equations using a fully adaptive mesh strategy
Author
Armstrong, G.A. ; Ferguson, R.S. ; Flynn, J.G.
Author_Institution
Queen´s University of Belfast, Department of Electrical Engineering, Belfast, UK
Volume
22
Issue
16
fYear
1986
Firstpage
856
Lastpage
858
Abstract
The letter presents a novel means of mesh adaption when the finite-element method is applied to the semiconductor equations. Using triangular elements it has the ability to avoid obtuse angles while still allowing flexibility in mesh design. The usefulness of the method is demonstrated by a simulation of an MOS device operating at a high drain voltage where generation due to impact ionisation becomes significant.
Keywords
finite element analysis; impact ionisation; metal-insulator-semiconductor devices; semiconductor device models; drain voltage; fully adaptive mesh strategy; impact ionisation; semiconductor equations; triangular elements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19860586
Filename
4256791
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