• DocumentCode
    1025091
  • Title

    Solution of semiconductor equations using a fully adaptive mesh strategy

  • Author

    Armstrong, G.A. ; Ferguson, R.S. ; Flynn, J.G.

  • Author_Institution
    Queen´s University of Belfast, Department of Electrical Engineering, Belfast, UK
  • Volume
    22
  • Issue
    16
  • fYear
    1986
  • Firstpage
    856
  • Lastpage
    858
  • Abstract
    The letter presents a novel means of mesh adaption when the finite-element method is applied to the semiconductor equations. Using triangular elements it has the ability to avoid obtuse angles while still allowing flexibility in mesh design. The usefulness of the method is demonstrated by a simulation of an MOS device operating at a high drain voltage where generation due to impact ionisation becomes significant.
  • Keywords
    finite element analysis; impact ionisation; metal-insulator-semiconductor devices; semiconductor device models; drain voltage; fully adaptive mesh strategy; impact ionisation; semiconductor equations; triangular elements;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860586
  • Filename
    4256791