• DocumentCode
    1025224
  • Title

    Thermal Management in 2.3- μm Semiconductor Disk Lasers: A Finite Element Analysis

  • Author

    Kemp, Alan J. ; Hopkins, John-Mark ; Maclean, Alexander J. ; Schulz, Nico ; Rattunde, Marcel ; Wagner, Joachim ; Burns, David

  • Author_Institution
    Univ. of Strathclyde, Glasgow
  • Volume
    44
  • Issue
    2
  • fYear
    2008
  • Firstpage
    125
  • Lastpage
    135
  • Abstract
    Finite element analysis is used to study heat flow in a 2.3-mum semiconductor disk laser (or vertical-external-cavity surface-emitting laser) based on GalnAsSb-AlGaAsSb. An intra-cavity diamond heatspreader is shown to significantly improve thermal management-and hence power scalability-in this laser compared to the substrate thinning approach typically used in semiconductor disk lasers operating around 1 mum. The parameters affecting the performance of an intracavity heat-spreader are studied in the context of a 2.3-mum semiconductor disk laser: the thermal impedance at the interface between the semiconductor gain material and the heatspreader is found to be much more important than the mounting arrangements for the gain-heatspreader composite; power scaling with pump spot radius-increasing the pump power at constant pump intensity-is found to be intrinsically limited; and the pump wavelength is predicted to have less affect on thermal management than might be expected. Direct pumping of the quantum wells is found to significantly reduce the temperature rise per unit pump power.
  • Keywords
    III-V semiconductors; aluminium compounds; finite element analysis; gallium arsenide; gallium compounds; indium compounds; laser cavity resonators; microdisc lasers; optical pumping; semiconductor device packaging; semiconductor lasers; surface emitting lasers; thermal management (packaging); GaInAsSb-AlGaAsSb; finite element analysis; intra-cavity diamond heatspreader; power scalability; power scaling; pump spot radius; quantum wells; semiconductor disk lasers; semiconductor gain material; substrate thinning; thermal impedance; thermal management; vertical-external-cavity surface-emitting laser; wavelength 2.3 mum; Energy management; Finite element methods; Heat pumps; Laser excitation; Power lasers; Semiconductor lasers; Substrates; Surface emitting lasers; Thermal management; Vertical cavity surface emitting lasers; Diode-pumped solid-state lasers; semiconductor disk lasers; vertical-external-cavity surface-emitting lasers (VECSELs );
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2007.911673
  • Filename
    4418449