• DocumentCode
    1025398
  • Title

    Spin-on films add new dimension to ULSI circuits

  • Author

    Giannelis, E.P. ; Shacham-Diamand, Yosi Y.

  • Author_Institution
    Cornell Univ., Ithaca, NY, USA
  • Volume
    9
  • Issue
    6
  • fYear
    1993
  • Firstpage
    30
  • Lastpage
    34
  • Abstract
    Spin-on oxide films, natural candidates for improving interlevel dielectric planarization in ULSI circuits, are reviewed. The spin-on process, one in which a thin film is produced by spin-casting a liquid on a rotating wafer, is described. Spin-on films combine the planarization capabilities of a fluid with the dielectric properties of an oxide. They fill all the lower regions over the wafer and produce a planar top layer. Spin-on insulators can be used in combination with chemically-vapor-deposited (CVD) materials, and can also be combined with an etchback step to improve planarization. As a result, the depths of vias in the etching process can be made more uniform, and voids in the filling of via-contacts, which become a significant problem as the via size shrinks, can be eliminated.<>
  • Keywords
    VLSI; coating techniques; dielectric thin films; integrated circuit technology; ULSI circuits; etching process; interlevel dielectric planarization; rotating wafer; spin-casting; spin-on oxide films; spin-on process; vias; Capacitors; Circuits; Dielectric materials; Dielectric thin films; Ferroelectric films; Ferroelectric materials; Optical films; Planarization; Random access memory; Ultra large scale integration;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.261889
  • Filename
    261889