Title :
Noncontact electro-optic sampling with a GaAs injection laser
Author :
Nees, John ; Mourou, Gerard
Author_Institution :
University of Rochester, Laboratory for Laser Energetics, Rochester, USA
Abstract :
30 ps pulses from a diode laser have been used to perform noncontact electric field measurements using a versatile `finger probe¿ electro-optic sampling technique.
Keywords :
III-V semiconductors; electric field measurement; electro-optical devices; gallium arsenide; measurement by laser beam; semiconductor junction lasers; 30 ps pulses; electro-optic sampling system; noncontact electric field measurements; semiconductor laser; substrate-independent probing geometry;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860626
