DocumentCode
1025650
Title
Automated Testing of LSI
Author
Rasmussen, R.A.
Author_Institution
IBM General Technology Division
Volume
15
Issue
3
fYear
1982
fDate
3/1/1982 12:00:00 AM
Firstpage
69
Lastpage
78
Keywords
Automatic testing; Circuit testing; Large scale integration; Logic circuits; Logic devices; Logic testing; Performance evaluation; Software testing; System testing; Test equipment;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.1982.1653974
Filename
1653974
Link To Document