DocumentCode
1025685
Title
The noise performance of microwave transistors
Author
Fukui, Hiroshi
Author_Institution
Bell Telephone Laboratories, Inc., Murray Hill, N. J.
Issue
3
fYear
1966
fDate
3/1/1966 12:00:00 AM
Firstpage
329
Lastpage
341
Abstract
Expressions for the noise parameters of microwave transistors are derived. The theory is based on a small-signal common-emitter equivalent circuit which includes a new basic noise equivalent circuit and the dominanting header parasitics. The theory is verified experimentally in the L-band (1 to 2 Gc/s) frequency range using Ge and Si microwave transistors. It is found that the header parasitics have little influence on the minimum noise figure, but do have large effects on the equivalent noise resistance and the optimum source admittance in the frequency region above about one-half of the series-resonant frequency resulting from the parasitics in conjunction with wafer parameters. For a quick evaluation of the noise performance, new approximate expressions are also given for the noise figure and for the optimum current which produces the lowest value.
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1966.15689
Filename
1474279
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