• DocumentCode
    1025685
  • Title

    The noise performance of microwave transistors

  • Author

    Fukui, Hiroshi

  • Author_Institution
    Bell Telephone Laboratories, Inc., Murray Hill, N. J.
  • Issue
    3
  • fYear
    1966
  • fDate
    3/1/1966 12:00:00 AM
  • Firstpage
    329
  • Lastpage
    341
  • Abstract
    Expressions for the noise parameters of microwave transistors are derived. The theory is based on a small-signal common-emitter equivalent circuit which includes a new basic noise equivalent circuit and the dominanting header parasitics. The theory is verified experimentally in the L-band (1 to 2 Gc/s) frequency range using Ge and Si microwave transistors. It is found that the header parasitics have little influence on the minimum noise figure, but do have large effects on the equivalent noise resistance and the optimum source admittance in the frequency region above about one-half of the series-resonant frequency resulting from the parasitics in conjunction with wafer parameters. For a quick evaluation of the noise performance, new approximate expressions are also given for the noise figure and for the optimum current which produces the lowest value.
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1966.15689
  • Filename
    1474279