• DocumentCode
    1025868
  • Title

    Testing and Fault Tolerance of Multistage Interconnection Networks

  • Author

    Agrawal, Dharma P.

  • Author_Institution
    Wayne State University
  • Volume
    15
  • Issue
    4
  • fYear
    1982
  • fDate
    4/1/1982 12:00:00 AM
  • Firstpage
    41
  • Lastpage
    53
  • Keywords
    Circuit faults; Computer networks; Concurrent computing; Fault tolerance; Large scale integration; Multiprocessor interconnection networks; Parallel processing; Switches; Testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1982.1653997
  • Filename
    1653997