DocumentCode
1025868
Title
Testing and Fault Tolerance of Multistage Interconnection Networks
Author
Agrawal, Dharma P.
Author_Institution
Wayne State University
Volume
15
Issue
4
fYear
1982
fDate
4/1/1982 12:00:00 AM
Firstpage
41
Lastpage
53
Keywords
Circuit faults; Computer networks; Concurrent computing; Fault tolerance; Large scale integration; Multiprocessor interconnection networks; Parallel processing; Switches; Testing; Very large scale integration;
fLanguage
English
Journal_Title
Computer
Publisher
ieee
ISSN
0018-9162
Type
jour
DOI
10.1109/MC.1982.1653997
Filename
1653997
Link To Document