Title :
Off Line, Built-in Test Techniques for VLSI Circuits
Author :
Buehler, Martin G. ; Sievers, Michael W.
Author_Institution :
Jet Propulsion Laboratory, California Institute of Technology
fDate :
6/1/1982 12:00:00 AM
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Integrated circuit modeling; Integrated circuit testing; Software testing; System testing; Very large scale integration;
DOI :
10.1109/MC.1982.1654052
