• DocumentCode
    1026439
  • Title

    Off Line, Built-in Test Techniques for VLSI Circuits

  • Author

    Buehler, Martin G. ; Sievers, Michael W.

  • Author_Institution
    Jet Propulsion Laboratory, California Institute of Technology
  • Volume
    15
  • Issue
    6
  • fYear
    1982
  • fDate
    6/1/1982 12:00:00 AM
  • Firstpage
    69
  • Lastpage
    82
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Hardware; Integrated circuit modeling; Integrated circuit testing; Software testing; System testing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer
  • Publisher
    ieee
  • ISSN
    0018-9162
  • Type

    jour

  • DOI
    10.1109/MC.1982.1654052
  • Filename
    1654052
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1026439