DocumentCode :
1026552
Title :
Progress in design for test: a personal view
Author :
Bennitts, R.G.
Author_Institution :
Synopsys Inc., Mountain Veiw, CA, USA
Volume :
11
Issue :
1
fYear :
1994
Firstpage :
53
Lastpage :
59
Abstract :
The author discusses the history and benefits of design for test. He describes common arguments against it and gives convincing rebuttals to each. In addition, he provides a glimpse into the future of DFT. The problem is that we do not have a measurable parameter that expresses the incremental gain in product quality arising from the addition of some specific DFT technique, compared to its cost of implementation. The author refers to this parameter as the quality improvement factor (Quif), and defines it as the benefit versus the cost of the DFT technique.<>
Keywords :
automatic test equipment; automatic testing; design for testability; Quif; design for test; future; history; incremental gain; measurable parameter; product quality; quality improvement factor; specific DFT technique; Application specific integrated circuits; Automatic test pattern generation; Automatic testing; Design for testability; History; Performance evaluation; Process design; Sequential analysis; Software tools; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/54.262322
Filename :
262322
Link To Document :
بازگشت