• DocumentCode
    1026953
  • Title

    New technique for analysing planar waveguides with finite metallisation thickness

  • Author

    Wu, K. ; Saguet, P.

  • Author_Institution
    Laboratoire d´´Electromagéntisme ENSERG, Grenoble, France
  • Volume
    22
  • Issue
    21
  • fYear
    1986
  • Firstpage
    1128
  • Lastpage
    1129
  • Abstract
    A new technique for analysing planar waveguides with finite metallisation thickness, based on the spectral-domain immitance approach, is presented. Fast formulation to the eigen-problem is proposed, and numerical results obtained in this way agree well with other methods.
  • Keywords
    eigenvalues and eigenfunctions; waveguide theory; finite metallisation thickness; planar waveguides; spectral-domain immitance approach;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19860773
  • Filename
    4256987
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1026953