A thermal feedback model is presented for the analytical definition of the ASO (Area of Safe Operation) for transistors in switching operations. This area is narrowed by the "second breakdown in p-n junction," and the approximate representation of the breakdown threshold is presented. This model consists of a forward and feedback energy flow with gains A and B, respectively.

. Therefore, the condition of the breakdown can be introduced as

, where

is the current multiplication factor, θ is transient thermal resistance,

is a newly introduced current concentration factor, and α
Ris the temperature coefficient of I
e. Experimental results are also reported for a germanium alloy type transistor.