DocumentCode :
1027208
Title :
The area of safe operation of transistors for switching operation
Author :
Oda, H.
Author_Institution :
Mitsubishi Electric Corporation, Kamakura City, Kanagawa Prefecture, Japan
Issue :
11
fYear :
1966
Firstpage :
776
Lastpage :
777
Abstract :
A thermal feedback model is presented for the analytical definition of the ASO (Area of Safe Operation) for transistors in switching operations. This area is narrowed by the "second breakdown in p-n junction," and the approximate representation of the breakdown threshold is presented. This model consists of a forward and feedback energy flow with gains A and B, respectively. A = V_{CE} \\times M, B = K \\times \\theta \\times \\alpha _{R} \\times I_{e} . Therefore, the condition of the breakdown can be introduced as 1 - AB = 0 , where M is the current multiplication factor, θ is transient thermal resistance, K is a newly introduced current concentration factor, and αRis the temperature coefficient of Ie. Experimental results are also reported for a germanium alloy type transistor.
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1966.15842
Filename :
1474432
Link To Document :
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