DocumentCode
1027279
Title
Influence of ion pairing on impurity profiles in double diffused silicon devices
Author
Cohen, B.G.
Author_Institution
Bell Telephone Laboratories, Inc.
Issue
11
fYear
1966
Firstpage
816
Lastpage
816
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1966.15849
Filename
1474439
Link To Document