Title :
Visually Servoed 3-D Alignment of Multiple Objects with Subnanometer Precision
Author :
Kim, Jung H. ; Menq, Chia-Hsiang
Author_Institution :
Dept. of Mech. Eng., Ohio State Univ., Columbus, OH
fDate :
5/1/2008 12:00:00 AM
Abstract :
This paper presents a visual measurement technique and the associated visual servo control method that enable 3-D alignment of multiple objects with subnanometer precision. Such high precision is achieved through eliminating the bias error caused by spatial sampling in the in-plane motion estimation, using a highly sensitive measurement technique based on interference for the out-of-plane motion, and continuously compensating for time varying uncertainties induced by mechanical forces and thermal drifts. The developed measurement technique is integrated with a motion stage to experimentally demonstrate visually servoed 3-D alignment, in which two microcantilevers are aligned in the 3-D space with alignment errors below 1 nm (rms) in all axes. Nanostepping of 0.5 nm magnitude along the out-of-plane z-axis is also performed between the two microcantilevers to illustrate the super precision of the visually served 3-D alignment.
Keywords :
cantilevers; micromechanical devices; motion estimation; visual servoing; bias error; in-plane motion estimation; interference; microcantilevers; multiple object 3-D alignment; nanostepping; out-of-plane motion; out-of-plane z-axis; spatial sampling; thermal drifts; visual servo control; Image motion analysis; image motion analysis; image registration; interferometry; motion control; motion control; visual servo control;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2007.914997