• DocumentCode
    1027347
  • Title

    Comparative Study on Drive Current of III–V Semiconductor, Ge and Si Channel n- mosfets based on Quantum-Corrected Monte Carlo Simulation

  • Author

    Mori, Takashi ; Azuma, Yüsuke ; Tsuchiya, Hideaki ; Miyoshi, Tanroku

  • Author_Institution
    Kobe Univ., Kobe
  • Volume
    7
  • Issue
    2
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    237
  • Lastpage
    241
  • Abstract
    Recently, a variety of new channel materials have been intensively studied to achieve a continuous enhancement in drive current of n-channel MOSFETs. In this paper, we performed a quantum-corrected Monte Carlo device simulation to examine advantages of new channel materials such as III-V compound semiconductors and Ge, by considering scattering effects, quantum mechanical effects, and new device structure. Then, we found that all materials converge to the similar current level as the channel length decreases, but Ge-MOSFET with (111) surface orientation and InP-MOSFET provide higher drive current than the other materials under the quasi-ballistic transport. Furthermore, we demonstrated that the reduction of parasitic resistance in source and drain regions will be indispensable to maintain a definite advantage of III-V materials.
  • Keywords
    III-V semiconductors; MOSFET; Monte Carlo methods; ballistic transport; elemental semiconductors; germanium; indium compounds; semiconductor device models; silicon; Ge; III-V semiconductor; InP; Si; channel length; drive current; parasitic resistance; quantum mechanical effects; quantum-corrected Monte Carlo simulation; quasiballistic transport; scattering effects; semiconductor channel n-MOSFET; surface orientation; Ballistic transport; ballistic transpot; drive current; high mobility channel materials; nanoscale mosfets; nanoscale MOSFETs; quantum-corrected Monte Carlo (MC) simulation; quantum-corrected Monte Carlo simulation;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2007.915002
  • Filename
    4420102