Title :
High-Reliable and High-Speed 1.3 μm Complex-Coupled Distributed Feedback Buried-Heterostructure Laser Diodes With Fe-Doped InGaAsP/InP Hybrid Grating Layers Grown by MOCVD
Author :
Lee, Feng-Ming ; Tsai, Chia-Lung ; Hu, Chih-Wei ; Cheng, Fu-Yi ; Wu, Meng-Chyi ; Lin, Chia-Chien
Author_Institution :
Nat. Tsing-Hua Univ., Hsinchu
Abstract :
In this paper, we report the fabrication of high-reliability and high-speed 1.3 mum complex-coupled distributed feedback (CC-DFB) buried heterostructure (BH) laser diodes (LDs) with Fe-doped InGaAsP/InP hybrid grating layers. High optical coupling coefficient and eminent current confining ability are accomplished by combining the Fe-doped InGaAsP/InP current-blocking-grating (CBG) layers to provide both the distributed-feedback index-and gain-coupling coefficients. Besides, the narrow-stripe BH LDs are implemented by burying the active region with a Fe-doped InP current-blocking layer during the epitaxial regrowth. The fabricated CBG CC-DFB BH LDs at 20degC shows a low threshold current of 5.3 mA, a maximum light output power of 36 mW at 100 mA, a high slope efficiency of 0.41 mW/mA, and a side-mode suppression ratio (SMSR) of 42 dB at twice the threshold. In addition, these LDs exhibit a maximum operation temperature of 125degC, an extremely low threshold current of 15.8 mA at 90degC, a small variation in slope efficient of only -1 dB in the temperature range from 20degC to 80degC, and a characteristic temperature of 77 K and 56 K between 20 degC and 60degC, and 70degC and 120degC, respectively. Furthermore, these 1.3 mum CBG CC-DFB BH LDs exhibit a high-speed characteristic up to 11.8 GHz at room temperature and an estimated median lifetime of more than 1.1 times 105 h or 12.5 years at 5 mW and 85degC.
Keywords :
MOCVD; distributed feedback lasers; epitaxial growth; gallium arsenide; indium compounds; iron; laser beams; reliability; semiconductor heterojunctions; semiconductor lasers; CC-DFB; InGaAsP:Fe-InP; buried heterostructure laser diodes; complex-coupled distributed feedback laser diodes; current 100 mA; current 15.8 mA; current 5.3 mA; current-blocking-grating layers; distributed-feedback index-coefficients; eminent current confining ability; epitaxial regrowth; gain-coupling coefficients; high optical coupling coefficient; hybrid grating layers; narrow-stripe BH LDs; power 36 mW; side-mode suppression ratio; size 1.3 mum; temperature 125 C; temperature 20 C; temperature 20 C to 80 C; temperature 293 K to 298 K; temperature 56 K; temperature 77 K; temperature 90 C; Diode lasers; Distributed feedback devices; Gratings; Indium phosphide; MOCVD; Optical coupling; Optical device fabrication; Power generation; Temperature distribution; Threshold current; Complex-coupled; current-blocking grating (CBG); distributed feedback (DFB) laser diodes;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.912948