Title :
Microstructural development in Co-Cr films for perpendicular recording media
Author :
Lee, J.W. ; Demczyk, B.G. ; Mountfield, K.R. ; Laughlin, D.E.
Author_Institution :
Carnegie Mellon University, Pittsburgh, Pennsylvania, USA
fDate :
9/1/1987 12:00:00 AM
Abstract :
A series of Co-Cr films have been examined using transmission electron microscopy (TEM) in bright/dark field imaging, and selected area diffraction (SAD) as well as convergent beam electron diffraction (CBED). Examination of the early stages of deposition by a DC magnetron provides evidence that amorphous Co-Cr films form prior to small randomly oriented equiaxed grains. Occasionally, a mixture of equiaxed and elongated grains were observed in the plane-view. Furthermore, microvoids are present running parallel to the columnar boundaries in cross-section view and at grain boundaries/edges in plane-view. In addition to conical and straight columnar grains, a mixture of small equiaxed and elongated grains were observed in cross-section view.
Keywords :
Perpendicular magnetic recording; Amorphous materials; Crystallization; Diffraction; Electron beams; Magnetic films; Materials science and technology; Optical films; Perpendicular magnetic recording; Reflection; Substrates;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065322