Title :
Influence of mobility and lifetime variations on drift-field effects in silicon-junction devices
Author :
Bullis, W.Murray ; Runyan, W.R.
Author_Institution :
National Bureau of Standards, Washington, D. C.
fDate :
2/1/1967 12:00:00 AM
Abstract :
An analysis of devices with drift fields formed by an impurity gradient is carried out allowing for lifetime and mobility variations with impurity concentration. In the case of silicon n-on-p photovoltaic solar cells, a field width of about twice the diffusion length of the minority carriers maximizes the collection efficiency. For lifetimes longer than one microsecond the optimum field width is about 25 µm, a value governed by the absorption characteristics rather than the diffusion length. In most cases, increasing the concentration ratio above 3 orders of magnitude is of little or no assistance in improving the collection efficiency. It is also shown that if the constant relating lifetime to high energy-particle flux is a strong function of impurity concentration, there is little advantage in using drift-field solar cell structures to enhance radiation resistance.
Keywords :
Absorption; Electric resistance; Electron mobility; Germanium; Impurities; Instruments; Photovoltaic cells; Photovoltaic systems; Silicon; Solar power generation;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.15902