DocumentCode
1028025
Title
Supply current testing in linear bipolar ICs
Author
Papakostas, D.K. ; Hatzopoulos, A.A.
Author_Institution
Dept. of Electr. Eng., Aristotelian Univ. of Thessaloniki, Greece
Volume
30
Issue
2
fYear
1994
fDate
1/20/1994 12:00:00 AM
Firstpage
128
Lastpage
130
Abstract
Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.
Keywords
bipolar integrated circuits; electric current measurement; fault location; integrated circuit testing; linear integrated circuits; operational amplifiers; 741 type; IC testing; bipolar integrated circuits; current sensing method; fault coverage; fault detection; fault modelling; linear bipolar ICs; nonlinear operation; opamp; power supply current measurements; supply current testing;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19940088
Filename
265304
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