Title :
Supply current testing in linear bipolar ICs
Author :
Papakostas, D.K. ; Hatzopoulos, A.A.
Author_Institution :
Dept. of Electr. Eng., Aristotelian Univ. of Thessaloniki, Greece
fDate :
1/20/1994 12:00:00 AM
Abstract :
Fault detection in linear bipolar integrated circuits using power supply current measurements is investigated. The most prevalent, catastrophic and parametric faults, have been modelled for a representative (741 type) opamp. The circuit is simulated under both linear and nonlinear operation. Comparative results between power supply current and output voltage measurements are given, showing the improvement in fault coverage by the use of the current sensing method.
Keywords :
bipolar integrated circuits; electric current measurement; fault location; integrated circuit testing; linear integrated circuits; operational amplifiers; 741 type; IC testing; bipolar integrated circuits; current sensing method; fault coverage; fault detection; fault modelling; linear bipolar ICs; nonlinear operation; opamp; power supply current measurements; supply current testing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940088
