DocumentCode :
1028045
Title :
Magnetic property and structural changes in TbFeCo by heat treatment below crystallization temperature
Author :
Yumoto, S. ; Toki, K. ; Tsukamoto, Y. ; Habara, T. ; Okada, U. ; Yokota, H. ; Gokan, H.
Author_Institution :
Microelectronics Research Labs., NEC Corporation, Kawasaki, Japan
Volume :
23
Issue :
5
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
2605
Lastpage :
2607
Abstract :
In magneto-optical recording using sputtered TbFeCo, it was observed that writing sensitivity appreciably increases after writing/erasing repetitions. To clarify this phenomena, magnetic properties in TbFeCo were evaluated before and after heat treatment below crystallization temperature. It was found that the Kerr rotation, coercive force, and perpendicular magnetic anisotropy decrease after heat treatment. The writing sensitivity increase can be explained by the coercive force decrease after writing/erasing repetitions. To examine the magnetic property change, mechanical and structural properties in TbFeCo were investigated. After heat treatment, Young´s modulus decreases and internal stress is drastically reduced to near O. A high resolution image of the as-sputtered TbFeCo cross section reveals that sputtered TbFeCo is comprised of crystal-like micrograins, about 20Å in diameter, and amorphous regions. As the causes of property changes, the oxidation and the structural relaxation can be considered. After heat treatment, the compensation composition and the compensation temperature didn´t change in the present experiment. Thus the possibility of the oxidation can be ruled out. From the drastic decrease of the internal stress, it is considered that the structural relaxation occurs in amorphous regions after heat treatment.
Keywords :
Magnetic thermal factors; Magnetooptic memories; Amorphous materials; Coercive force; Crystallization; Heat treatment; Internal stresses; Magnetic properties; Magnetooptic recording; Oxidation; Temperature sensors; Writing;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1987.1065367
Filename :
1065367
Link To Document :
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