DocumentCode
1028218
Title
A model of the avalanche photodiode
Author
Biard, James R. ; Shaunfield, W.N., Jr.
Author_Institution
Texas Instruments Incorporated, Dallas, Tex.
Volume
14
Issue
5
fYear
1967
fDate
5/1/1967 12:00:00 AM
Firstpage
233
Lastpage
238
Abstract
A general model for the avalanche photodiode is presented. It is shown that the diode consists of four regions: 1) guard ring, 2) uniform avalanche region, 3) high-field absorption region and 4) zero-field absorption region. Expressions are given for the ac quantum efficiency, the dc quantum efficiency, and the transit time cutoff frequency. Material requirements are discussed. Based on an entire detector system, an expression is derived for the signal-to-noise ratio. An example is given with the result that a noise-equivalent power (NEP) of 10-12W/Hz1/2is obtained with an optimum avalanche gain of approximately 23.
Keywords
Absorption; Avalanche photodiodes; Cutoff frequency; Detectors; Electric breakdown; Optical modulation; P-i-n diodes; Semiconductor device noise; Semiconductor diodes; Solid state circuits;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1967.15936
Filename
1474659
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