Title :
Oscillator performance from the time evolution of relative phase
Author :
Luiten, A.N. ; Tobar, M.E. ; Blair, D.G.
fDate :
1/20/1994 12:00:00 AM
Abstract :
An improved method is described for simultaneously evaluating the fractional frequency stability and phase noise spectrum of ultrastable microwave oscillators from a digitised recording of a zero Hertz beat waveform between two such oscillators. To illustrate the new technique results are presented from a study of two ultrastable cryogenic sapphire oscillators which have a fractional frequency stability near 10-15 at 1 s integration time.
Keywords :
electric noise measurement; frequency stability; low-temperature techniques; microwave measurement; microwave oscillators; sapphire; solid-state microwave circuits; 11.9 GHz; digitised recording; fractional frequency stability; noise measurement; noise spectral density; phase noise spectrum; relative phase time evolution; ultrastable cryogenic sapphire oscillators; ultrastable microwave oscillators; zero Hertz beat waveform;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19940090
