Title :
Optimal structure for microgrooved cooling fin for high-power LSI devices
Author :
Sasaki, Seishi ; Kishimoto, T.
Author_Institution :
NTT, Electronics & Mechanics Technology Laboratories, Musashino, Japan
Abstract :
We have evaluated the relationship between the cooling capability and the channel width with a constant pressure drop for microgrooved cooling fins, and found that there are optimal channel widths which give rise to the maximum allowable power density. There are also optimal microgrooved cooling fin structures in which enlarged channel widths are sufficient to cool high-power-consumption wafer-scale integrated chips with a pressure drop of only 200 kg/m2.
Keywords :
cooling; large scale integration; packaging; channel width; constant pressure drop; cooling capability; high-power LSI devices; microgrooved cooling fin; optimal channel widths; power density; wafer-scale integrated chips;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19860916