DocumentCode
1028424
Title
Minimum yield for economical probing of semiconductor devices
Author
Ansley, W.G.
Volume
14
Issue
6
fYear
1967
fDate
6/1/1967 12:00:00 AM
Firstpage
338
Lastpage
339
Keywords
Computed tomography; Cost function; Feedback; Noise level; Probes; Radiative recombination; Semiconductor device noise; Semiconductor devices; Semiconductor diodes; Testing;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1967.15957
Filename
1474680
Link To Document