• DocumentCode
    1028504
  • Title

    Intermodulation distortion of a bipolar common-emitter amplifier with arbitrary emitter impedance and input matching network

  • Author

    Hurkx, G.A.M. ; Van der Heijden, Edwin

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • Volume
    51
  • Issue
    7
  • fYear
    2004
  • fDate
    7/1/2004 12:00:00 AM
  • Firstpage
    1241
  • Lastpage
    1249
  • Abstract
    In this paper, concise formulas for the intermodulation distortion of a bipolar common-emitter amplifier stage with arbitrary emitter impedance and input matching network are presented. These expressions provide quantitative insight in the influence of transistor properties, emitter degeneration and input power matching on distortion. Only a small set of measurable transistor parameters is needed. As examples, IIP3 is calculated for transistor only, transistor with emitter inductance, and transistor with emitter inductance and input matching circuit. Two transistors are compared: a double-poly Si transistor and a SiGe transistor in a similar process. A good agreement between analytical and numerical results is obtained.
  • Keywords
    amplifiers; bipolar transistors; intermodulation distortion; SiGe; arbitrary emitter impedance; bipolar common-emitter amplifier; bipolar transistor; emitter degeneration; emitter inductance; input matching network; input power matching; intermodulation distortion; transistor parameters; transistor properties; Bipolar transistors; Circuit testing; Distortion measurement; Germanium silicon alloys; Impedance matching; Inductance; Intermodulation distortion; Linearity; Numerical simulation; Silicon germanium; Amplifier; bipolar transistor; intermodulation distortion;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2004.830684
  • Filename
    1310495