DocumentCode :
1028507
Title :
Short-Time Annealing Characteristics of Electrical Conductors
Author :
Roehmann, L.F. ; Hazan, Earl
Author_Institution :
Kaiser Aluminum and Chemical Corporation
Volume :
82
Issue :
69
fYear :
1963
Firstpage :
1061
Lastpage :
1068
Abstract :
Loss in strength is a function of conductor maximum temperature which, itself, is a function of I2t. Instead of producing currents and times as they may occur in the field, one can, in the laboratory, choose more convenient values giving the same I2t, the same maximum temperature and the same loss in strength. Using this approach, diagrams were developed showing, for electrically equivalent copper and aluminum conductors, the current-time relations producing specific degradations.
Keywords :
Aluminum; Annealing; Circuit faults; Conducting materials; Conductivity; Conductors; Copper; Degradation; Materials testing; Temperature;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1963.291493
Filename :
4072907
Link To Document :
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