High-temperature superconductive devices on sapphire

Author

Liang, Guo-Chun ; Withers, Richard S. ; Cole, Brady F. ; Newman, Nathan

Author_Institution

Conductus Inc., Sunnyvale, CA, USA

Volume

42

Issue

1

fYear

1994

fDate

1/1/1994 12:00:00 AM

Firstpage

34

Lastpage

40

Abstract

The low-loss and uniform dielectric properties of sapphire make it attractive for high-performance microwave devices using high-temperature superconductors. YBa₂Cu₃O_7-δ films have been deposited on oxide-buffered 5-cm-diameter wafers and demonstrated a surface resistance of 0.5 mΩ at 10 GHz and 77 K. Long (9-ns) stripline delay lines have for the first time been produced on these substrates and have a measured insertion loss of 1.5 dB at 6 GHz and 77 K. Design techniques appropriate for the dielectric anisotropy of sapphire are discussed

Keywords

barium compounds; delay lines; high-temperature superconductors; sapphire; strip line components; superconducting microwave devices; superconducting thin films; yttrium compounds; 0.5 mohm; 1.5 dB; 10 GHz; 5 cm; 6 GHz; 77 K; 9 ns; Al₂O₃; HTSC; SHF; YBCO; YBa₂Cu₃O_7-δ films; YBa₂Cu₃O₇-Al₂O₃; dielectric anisotropy; high-temperature superconductors; insertion loss; low-loss substrate; microwave devices; oxide-buffered wafers; sapphire substrate; stripline delay lines; superconductive devices; uniform dielectric properties; Delay lines; Dielectric devices; Dielectric loss measurement; Dielectric substrates; High temperature superconductors; Stripline; Superconducting films; Superconducting microwave devices; Superconductivity; Surface resistance;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.265525

Filename

265525