A novel technique for the analysis of dielectric height variations in microstrip circuits

Author

Kouki, Ammar B. ; Khebir, Ahmed ; Bosisio, Renato G. ; Ghannouchi, Fadhel M.

Author_Institution

Microwave Res. Lab., Ecole Polytech. de Montreal, Que., Canada

Volume

42

Issue

1

fYear

1994

fDate

1/1/1994 12:00:00 AM

Firstpage

73

Lastpage

77

Abstract

This paper presents a technique based on the full-wave, two-dimensional spectral domain method and the distributed transmission line approach to analyze structures with a combination of conductor width and dielectric height variations. The technique is applied to a regular taper and the results are compared with existing models. A matched taper transition is then designed based on simultaneous variation of the conductor width and dielectric height such that their ratio is kept constant. The analysis of such tapers is carried out and compared to measured data. It is shown that significant reduction in the return loss can be achieved with such transitions over fairly wide, tunable frequency ranges

Keywords

S-parameters; impedance matching; microstrip lines; spectral-domain analysis; transmission line theory; conductor width variation; dielectric height variations; distributed transmission line approach; full-wave two-dimensional spectral domain method; impedance profile; matched taper transition; microstrip circuits; regular taper; return loss reduction; scattering parameters; tunable frequency ranges; Computer aided manufacturing; Conductors; Dielectric measurements; Distributed parameter circuits; Frequency; Impedance; Integrated circuit measurements; Microstrip; Printed circuits; Tunable circuits and devices;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.265531

Filename

265531