Title :
Influence of bulk and surface properties on the performance of silicon diode arrays for image sensing
Author :
Buck, T.M. ; Dalton, J.V. ; Yamin, M.
fDate :
9/1/1967 12:00:00 AM
Keywords :
Capacitance measurement; Dark current; Diodes; Optical arrays; Pulse measurements; Rough surfaces; Silicon; Solid state circuits; Surface roughness; Transconductance;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.16021
