Title :
Near-field emission studies and degradation effects in GaAs injection lasers
fDate :
9/1/1967 12:00:00 AM
Keywords :
Degradation; Electroluminescence; Electron emission; Electron mobility; Gallium arsenide; Geometry; Laboratories; Magnetic analysis; Silicon; Temperature;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1967.16040
