• DocumentCode
    1029362
  • Title

    Annealing Effect on the Formation of In(Ga)As Quantum Rings From InAs Quantum Dots

  • Author

    Dai, Jong-Horng ; Lee, Jheng-Han ; Lee, Si-Chen

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • Volume
    20
  • Issue
    2
  • fYear
    2008
  • Firstpage
    165
  • Lastpage
    167
  • Abstract
    The correlation between the In(Ga)As quantum rings (QRs) and their precursors InAs quantum dots (QDs) are studied by changing the annealing time after the deposition of a thin InAs layer on GaAs. The atomic force microscopy and photoluminescence (PL) are used to characterize the morphologies and electronic states of QDs and QRs. The longer annealing time tends to enlarge the QD size to high aspect ratio, group InAs islands into several different sizes, and red-shift the PL peak. The resultant QRs show the ridge-confined rings and the PL peaks of QRs blue-shift with increasing QD aspect ratio. It demonstrates an important way to tailor the electronics states of QRs.
  • Keywords
    III-V semiconductors; annealing; atomic force microscopy; band structure; gallium arsenide; indium compounds; photoluminescence; semiconductor quantum dots; spectral line shift; InAs; InGaAs; annealing; aspect ratio; atomic force microscopy; blue-shift; electronic states; morphologies; photolumines-cence; quantum dots; quantum rings; Annealing; Atom optics; Atomic force microscopy; Atomic layer deposition; Gallium arsenide; Molecular beam epitaxial growth; Optical microscopy; Photoluminescence; Quantum dots; Temperature; Adatom migration; annealing time; elastic relaxation; quantum dots (QDs); quantum rings (QRs);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2007.912481
  • Filename
    4427285