DocumentCode
1029362
Title
Annealing Effect on the Formation of In(Ga)As Quantum Rings From InAs Quantum Dots
Author
Dai, Jong-Horng ; Lee, Jheng-Han ; Lee, Si-Chen
Author_Institution
Nat. Taiwan Univ., Taipei
Volume
20
Issue
2
fYear
2008
Firstpage
165
Lastpage
167
Abstract
The correlation between the In(Ga)As quantum rings (QRs) and their precursors InAs quantum dots (QDs) are studied by changing the annealing time after the deposition of a thin InAs layer on GaAs. The atomic force microscopy and photoluminescence (PL) are used to characterize the morphologies and electronic states of QDs and QRs. The longer annealing time tends to enlarge the QD size to high aspect ratio, group InAs islands into several different sizes, and red-shift the PL peak. The resultant QRs show the ridge-confined rings and the PL peaks of QRs blue-shift with increasing QD aspect ratio. It demonstrates an important way to tailor the electronics states of QRs.
Keywords
III-V semiconductors; annealing; atomic force microscopy; band structure; gallium arsenide; indium compounds; photoluminescence; semiconductor quantum dots; spectral line shift; InAs; InGaAs; annealing; aspect ratio; atomic force microscopy; blue-shift; electronic states; morphologies; photolumines-cence; quantum dots; quantum rings; Annealing; Atom optics; Atomic force microscopy; Atomic layer deposition; Gallium arsenide; Molecular beam epitaxial growth; Optical microscopy; Photoluminescence; Quantum dots; Temperature; Adatom migration; annealing time; elastic relaxation; quantum dots (QDs); quantum rings (QRs);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2007.912481
Filename
4427285
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