Title :
The micro-structure of γ-Fe2O3film with Ar-O2-H2O process
Author :
Takagaki, T. ; Kataoka, H. ; Furusawa, K. ; Abe, K. ; Kamei, T. ; Sano, M.
Author_Institution :
Hitachi Ltd., Yokohama, Japan
fDate :
9/1/1987 12:00:00 AM
Abstract :
The micro-structure of the γ-Fe2O3film with reactive sputtering process in Ar-O2-H2O was studied using X-ray diffraction and a cross-sectional High-Resolution TEM. The results are as follows: the film has a columnar structure and the diameter of each column is 100-300 Å; both <111> oriented columns and micro-crystallite columns coexist in the film; the crystallinity in the micro-crystallite columns was found to contribute to the magnetic properties.
Keywords :
Magnetic recording; Crystallization; Glass; Lattices; Optical films; Semiconductor films; Substrates; X-ray diffraction; X-ray imaging;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065497