DocumentCode :
1029690
Title :
An analysis of the congestion effects of link failures in wide area networks
Author :
Tipper, David ; Hammond, Joseph L. ; Sharma, Sandeep ; Khetan, Archana ; Balakrishnan, Krishnan ; Menon, Sunil
Author_Institution :
Dept. of Electr. & Comput. Eng., Clemson Univ., SC, USA
Volume :
12
Issue :
1
fYear :
1994
fDate :
1/1/1994 12:00:00 AM
Firstpage :
179
Lastpage :
192
Abstract :
The authors present the results of a study to determine the effects of link failures on the performance of a network in terms of the occurrence of congestion due to traffic restoration after a failure. The network studied is a virtual circuit based packet switched wide area network. A generic queueing framework is developed to study the effect of failures and the subsequent traffic restoration on network performance. In general, the congestion resulting after a failure is a transient phenomenon. Hence, a numerical methods based nonstationary queueing analysis is conducted in order to quantify the effects of failures in terms of the transient behavior of queue lengths and packet loss probabilities. A bounding relationship is developed whereby a network node can determine whether or not congestion will occur as the result of traffic restoration after a failure
Keywords :
failure analysis; packet switching; probability; queueing theory; reliability; telecommunication links; telecommunication traffic; wide area networks; bounding relationship; congestion effects; link failures; network node; network performance; nonstationary queueing analysis; numerical method; packet loss probabilities; packet switched WAN; queue lengths; traffic congestion; traffic restoration; transient behavior; virtual circuit; wide area networks; Communication networks; Failure analysis; Intelligent networks; Packet switching; Queueing analysis; Switching circuits; Telecommunication network reliability; Telecommunication traffic; Traffic control; Wide area networks;
fLanguage :
English
Journal_Title :
Selected Areas in Communications, IEEE Journal on
Publisher :
ieee
ISSN :
0733-8716
Type :
jour
DOI :
10.1109/49.265717
Filename :
265717
Link To Document :
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