Title :
A sensitive, temperature-compensated, zero-bias floating gate MOSFET dosimeter
Author :
Tarr, N. Garry ; Shortt, Ken ; Wang, Yanbin ; Thomson, Ian
Author_Institution :
Dept. of Electron., Carleton Univ., Ottawa, Ont., Canada
fDate :
6/1/2004 12:00:00 AM
Abstract :
A new MOSFET dosimeter consisting of a floating gate sensor transistor and a reference transistor of identical geometry fabricated in close proximity on the same silicon chip is described. Sensitivity is maximized by not overlapping the floating gate with a control gate. The floating gate is precharged prior to irradiation by tunneling. No bias is applied during irradiation. The dosimeter output is the reference transistor gate bias required to give the same drain current in the sensor and reference MOSFETs at the same drain-source bias. Sensitivities up to 3 mV/rad have been achieved. The dosimeter provides excellent first-order temperature compensation. With second-order temperature compensation using an external temperature sensor, doses less than 500 mrad should be resolvable.
Keywords :
MOSFET; dosimeters; dosimetry; gamma-ray detection; nuclear electronics; radiation monitoring; readout electronics; CMOS; RADFET; control gate; drain current; drain-source bias; external temperature sensor; first-order temperature compensation; floating gate precharging characteristic; floating gate sensor transistor; gamma rays; irradiation phenomena; radiation sensing MOSFET; readout circuit; reference transistor gate bias; second-order temperature compensation; sensitive temperature-compensated zero-bias floating gate MOSFET dosimeter; silicon chip; tunneling; Biomedical measurements; CMOS technology; Councils; Geometry; Ionizing radiation; MOSFET circuits; Silicon; Temperature control; Temperature sensors; Tunneling; CMOS; MOSFET; RADFET; detector; dosimetry; gamma rays;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.829372