Title :
Impact of flicker noise and random-walk noise on a phase-locked loop with finite propagation delay
Author :
Norimatsu, Seiji ; Ishida, Osamu
Author_Institution :
NTT Transmission Syst. Labs., Yokosuka, Japan
fDate :
1/1/1994 12:00:00 AM
Abstract :
Approximate expressions for the phase-error variance due to the nonwhite frequency noise of optical sources are derived to analyze the performance of optical phase-locked loops (PLL´s). The approximation incorporates the loop propagation delay, which is inevitable in actual systems. The obtained expressions are in simple form and yield only 3% maximum error. Using the obtained expressions, the influence of the flicker frequency noise and the random-walk frequency noise on the laser linewidth requirements are discussed. By examining semiconductor lasers that have been reported, it is found, quantitatively, that the flicker frequency noise does not affect the linewidth requirements, even in the presence of finite loop propagation delay. The obtained approximate expressions are used to examine low-white-frequency-noise optical sources, such as solid-state lasers, and to yield the allowable values of flicker frequency noise and random-walk frequency noise
Keywords :
phase shift keying; phase-locked loops; random noise; semiconductor device noise; semiconductor lasers; solid lasers; white noise; approximate expressions; binary PSK; finite propagation delay; flicker frequency noise; flicker noise; homodyne/heterodyne detection; laser linewidth requirements; linewidth; loop propagation delay; low-white-frequency-noise optical sources,; nonwhite frequency noise; optical sources; phase-error variance; phase-locked loop; quadrature phase shift keying; random-walk frequency noise; random-walk noise; semiconductor lasers; solid-state lasers; 1f noise; Analysis of variance; Frequency; Laser noise; Optical noise; Performance analysis; Phase noise; Propagation delay; Semiconductor device noise; Semiconductor lasers;
Journal_Title :
Lightwave Technology, Journal of