• DocumentCode
    1029938
  • Title

    Noise figure of UHF transistors as a function of frequency and bias conditions

  • Author

    Agouridis, Dimitrios C. ; Van Der Ziel, Aldert

  • Author_Institution
    Memphis State University, Memphis, Tenn.
  • Volume
    14
  • Issue
    12
  • fYear
    1967
  • fDate
    12/1/1967 12:00:00 AM
  • Firstpage
    808
  • Lastpage
    816
  • Abstract
    It is shown that the observed values of the minimum noise figure F_{\\min} of UHF transistors in common base connection can be explained in terms of the device parameter (1-\\alpha _{dc}) r_{b\´b}/R_{e0} and fαfor frequencies up to 1000 MHz. An interesting collector saturation effect is observed that gives a strong increase in UHF noise figure at high currents. Many features of the dependance of F_{\\min} on operating conditions can be explained by this effect. The current dependence of F_{\\min} for large values of |VCB| and high currents suggests a distribution in diffusion times through the base region. At intermediate frequencies, the noise figure increases with increasing collector bias |VCB| due to an increase in r_{b\´b} , which in turn is caused by the dependence of the base width on |VCB|.
  • Keywords
    Circuits; Density estimation robust algorithm; Diodes; Electric breakdown; Electric variables measurement; Electron devices; Frequency measurement; Microwave transistors; Noise figure; P-n junctions;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1967.16114
  • Filename
    1474837