DocumentCode
1029938
Title
Noise figure of UHF transistors as a function of frequency and bias conditions
Author
Agouridis, Dimitrios C. ; Van Der Ziel, Aldert
Author_Institution
Memphis State University, Memphis, Tenn.
Volume
14
Issue
12
fYear
1967
fDate
12/1/1967 12:00:00 AM
Firstpage
808
Lastpage
816
Abstract
It is shown that the observed values of the minimum noise figure
of UHF transistors in common base connection can be explained in terms of the device parameter
and fα for frequencies up to 1000 MHz. An interesting collector saturation effect is observed that gives a strong increase in UHF noise figure at high currents. Many features of the dependance of
on operating conditions can be explained by this effect. The current dependence of
for large values of |VCB | and high currents suggests a distribution in diffusion times through the base region. At intermediate frequencies, the noise figure increases with increasing collector bias |VCB | due to an increase in
, which in turn is caused by the dependence of the base width on |VCB |.
of UHF transistors in common base connection can be explained in terms of the device parameter
and f
on operating conditions can be explained by this effect. The current dependence of
for large values of |V
, which in turn is caused by the dependence of the base width on |VKeywords
Circuits; Density estimation robust algorithm; Diodes; Electric breakdown; Electric variables measurement; Electron devices; Frequency measurement; Microwave transistors; Noise figure; P-n junctions;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1967.16114
Filename
1474837
Link To Document