A New Method to Extract Noise Parameters Based on a Frequency- and Time-Domain Analysis of Noise Power Measurements

Author

Giannini, Frédérique ; Bourdel, Emmanuelle ; Pasquet, Daniel

Author_Institution

Ecole Nat. Superieure de I´´Electron. et de ses, Cergy-Pontoise

Volume

57

Issue

2

fYear

2008

Firstpage

261

Lastpage

267

Abstract

A new on-wafer noise parameter measurement method at a 2.8-18-GHz frequency band is presented. This measurement method is based on both temporal and spectral analysis of noise power measurements. We present the method and the experimental results on an active two-port. It requires less equipment than the classic noise parameter measurement method. It gives direct results for 801 points in the 2.8-18-GHz frequency band.

Keywords

active networks; circuit noise; electric noise measurement; frequency-domain analysis; microwave measurement; time-domain analysis; two-port networks; active two-port network; frequency 2.8 GHz to 18 GHz; frequency-domain analysis; low-noise amplifiers; noise parameters extraction; noise power measurements; on-wafer noise parameter measurement method; spectral analysis; temporal analysis; time-domain analysis; Admittance; Frequency measurement; Impedance; Noise figure; Noise measurement; Power measurement; Spectral analysis; Switches; Testing; Time domain analysis; High-frequency noise; noise figure; noise measurement; noise parameters; time domain;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.909491

Filename

4427383