BIST for Measuring Clock Jitter of Charge-Pump Phase-Locked Loops

Author

Hsu, Jen-Chien ; Su, Chauchin

Author_Institution

Nat. Chiao Tung Univ., Hsinchu

Volume

57

Issue

2

fYear

2008

Firstpage

276

Lastpage

285

Abstract

This paper presents a built-in self-test (BIST) circuit that measures the clock jitter of the charge-pump phase-locked loops (PLLs). The jitter-measurement structure is based on a novel time-to-digital converter (TDC) which has a high resolution. A small area overhead is also achieved using the voltage-controlled oscillator and the loop filter of the PLL under test as parts of the TDC. The experiment result shows that the resolution is about 1 ps and that the measurement error is smaller than 20%.

Keywords

analogue-digital conversion; built-in self test; phase locked loops; timing jitter; voltage-controlled oscillators; PLL; analog BIST circuit; built-in self-test; charge-pump phase-locked loops; clock jitter measurement; loop filter; measurement error; time-to-digital converter; voltage-controlled oscillator; Built-in self-test; Charge pumps; Circuits; Clocks; Current measurement; Filters; Jitter; Phase locked loops; Phase measurement; Voltage-controlled oscillators; Analog built-in self-test (BIST); jitter measurement; on-chip measurement; phase-locked loop (PLL) BIST; timeto-digital converter (TDC);

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2007.910109

Filename

4427385