Title :
Noise in long p-i-n germanium diodes
Author :
Okamoto, Mitsuo ; Liu, S.T. ; van der Ziel, A.
fDate :
3/1/1968 12:00:00 AM
Keywords :
Alloying; Atmosphere; Frequency measurement; Germanium; Low-frequency noise; Noise measurement; P-i-n diodes; PIN photodiodes; Semiconductor device noise; Semiconductor diodes;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16160
