Title :
Estimation and Validation of Semiparametric Dynamic Nonlinear Models
Author :
Rolain, Yves ; Moer, Wendy Van ; Schoukens, Johan ; Dhaene, Tom
Author_Institution :
Vrije Univ. Brussel, Brussels
Abstract :
An approach for measurement-based modeling of nonlinear devices is proposed. The method that is commonly used for linear time-invariant systems, namely, parametric modeling and nonparametric verification, is hereby extended to a class of nonlinear systems. The applicability of the method is illustrated on the baseband modeling of a radio-frequency amplifier over a wide power and frequency range.
Keywords :
frequency-domain analysis; measurement theory; nonlinear dynamical systems; parameter estimation; radiofrequency amplifiers; baseband modeling; linear time-invariant systems; measurement-based modeling; nonlinear devices; nonparametric verification; parametric modeling; radio-frequency amplifier; semiparametric dynamic nonlinear models; Baseband; Context modeling; Frequency measurement; Nonlinear systems; Parametric statistics; Power amplifiers; Power system modeling; Radio frequency; Radiofrequency amplifiers; Visualization; High frequency; measurement; modeling; nonlinear systems; semiparametric;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2007.909959
