Title :
In this issue - Technically
Author :
Takeshita, Takaharu ; Sato, Takao ; Mitsuhara, Manabu ; Kondo, Yuta ; Sugo, M. ; Kato, Kazuhiko
Abstract :
In the above titled paper (ibid., vol. 54, no. 20, pp. 2644-2649, Oct. 07), there were errors for which corrections are presented here.
Keywords :
Distributed feedback devices; Failure analysis; Quantum well lasers; Semiconductor device reliability;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2007.912944
