DocumentCode
1030938
Title
Low-temperature process for high-mobility polysilicon TFTs
Author
Loisel, B. ; Chouan, Y. ; Pedrono, N. ; Joubert, P.
Author_Institution
Centre National d´´Etudes des Télécommunications, LAB-ROC/TIC, Lannion, France
Volume
23
Issue
6
fYear
1987
Firstpage
288
Lastpage
289
Abstract
Thin-film transistors (TFTs) have been realised by a low-temperature (T¿ 580°C), short process, on polycrystalline silicon thin films deposited by PECVD on glass. Field-effect mobility up to 35cm2V-1s-1 has been measured on such devices.
Keywords
chemical vapour deposition; elemental semiconductors; flat panel displays; semiconductor growth; silicon; thin film transistors; 580 C; PECVD; field effect mobility; flat panel display applications; high mobility poly-Si; low temperature process; polycrystalline Si; semiconductors; thin film transistors;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19870209
Filename
4257536
Link To Document