Title :
Anisotropy and coercivity of amorphous RE-TM films
Author :
Egami, T. ; Graham, C.D., Jr. ; Dmowski, W. ; Zhou, P. ; Flanders, P.J. ; Marinero, E.E. ; Notarys, H. ; Robinson, C.
Author_Institution :
University of Pennsylvania, Philadelphia, Pennsylvania
fDate :
9/1/1987 12:00:00 AM
Abstract :
The origins of magnetic anisotropy and coercivity in sputter-deposited amorphous rare earth-transition metal thin films are discussed, focussing on microscopic mechanisms. We point out that two distinct mechanisms, directional compositional short range order and bond-orientational anisotropy, have to be considered, and discuss relevant experimental results.
Keywords :
Amorphous magnetic films/devices; Coercive forces; Perpendicular magnetic anisotropy; Amorphous magnetic materials; Amorphous materials; Anisotropic magnetoresistance; Bonding; Coercive force; Magnetic anisotropy; Magnetic force microscopy; Magnetic separation; Magnetostatics; Magnetostriction;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.1987.1065651
