Title :
Radiation-resistant MOS devices
fDate :
6/1/1968 12:00:00 AM
Keywords :
Diodes; Electric resistance; Frequency; Germanium; Impedance; Laboratories; MOS devices; Temperature; Thermal conductivity; Thermal stability;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16237
