• DocumentCode
    1031237
  • Title

    Cyclic internal pressure tests of a force-cooled cable-in-conduit superconductor for a fusion application

  • Author

    Shibutani, Y. ; Naganuma, M. ; Shibui, M. ; Hamajima, T. ; Fujioka, T. ; Sawada, Y. ; Shimamoto, S. ; Nishi, M. ; Nakajima, H. ; Ando, T. ; Tsuji, H.

  • Author_Institution
    Toshiba Corp., Tokyo, Japan
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1149
  • Lastpage
    1152
  • Abstract
    Preliminary results on cyclic internal-pressure tests of a force-cooled, cable-in-conduit superconductor are presented. The tests were performed to assess the effects of initial crack configurations on the final failure modes. Three failure modes have been examined, namely break, leakage, and plastic collapse. Analyses have also been performed on crack propagation to understand the experimental results. Mechanical integrity of the conductor is discussed in terms of a two-parameter method. The experimental and analytical results indicate that plastic collapse or large local plastic deformation should be considered during the design of a conduit. The results also imply that a conduit having square cross section with functional separation of helium sealing and mechanically reinforcing subassemblies is promising for use in a large magnetic system.
  • Keywords
    composite superconductors; cracks; failure analysis; fusion reactor materials; mechanical testing; plastic deformation; superconducting magnets; break; crack configurations; crack propagation; cyclic internal-pressure tests; failure modes; force-cooled cable-in-conduit superconductor; fusion application; large magnetic system; leakage; local plastic deformation; mechanical integrity; plastic collapse; two-parameter method; Conductors; Helium; Magnetic analysis; Magnetic separation; Performance analysis; Performance evaluation; Plastics; Superconducting cables; Superconducting magnets; Testing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11435
  • Filename
    11435