Title :
The experimental evaluation of a static crossed-field photomultiplier
fDate :
6/1/1968 12:00:00 AM
Keywords :
Breakdown voltage; Capacitance; P-i-n diodes; P-n junctions; Photodiodes; Photomultipliers; Photovoltaic systems; Silicon carbide; Temperature dependence; Wavelength measurement;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16251
