Title :
Electrostatic pickup tube of the return-beam type
Author :
Schlesinger, K. ; Day, B.E. ; Wagner, R.A.
fDate :
6/1/1968 12:00:00 AM
Keywords :
Circuits; Electron optics; Electrostatics; Etching; Focusing; Magnetic anisotropy; Magnetic shielding; Perpendicular magnetic anisotropy; Silicon; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1968.16263
